PROGRAM CO-CHAIR
Program Committee
Program co-chairs
Topic chairs
T1 – Dependable AI and AI for Testing
T2 – Functional Safety, Fault Tolerance and Reliability
T3 – Methods for Emerging Technologies and Architectures
T4 – Security and Trust
T5 – Test and Reliability for Analog, Mixed-Signal, and RF
T6 – DFT, Test Access Standards and Test application
T7 – Validation, Verification, and Debug
T8 – Test Generation, Fault Modeling & Simulation, Diagnosis
Program Committee Members
To be updated.